"A genetic algorithm for probe testing problem on high-density PCB."

Keisuke Murakami (2012)

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DOI: 10.1109/CEC.2012.6253012

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Keisuke Murakami:
A genetic algorithm for probe testing problem on high-density PCB. IEEE Congress on Evolutionary Computation 2012: 1-8

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