"Two New Metrics for Feature Selection in Pattern Recognition."

Pedro Y. Piñero et al. (2003)

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DOI: 10.1007/978-3-540-24586-5_60

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  - conf/ciarp/PineroAGCYM03
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  - https://dblp.org/rec/conf/ciarp/PineroAGCYM03
Pedro Y. Piñero, Leticia Arco, María M. García, Yaile Caballero, Raykenler Yzquierdo, Alfredo Morales:
Two New Metrics for Feature Selection in Pattern Recognition. CIARP 2003: 488-497

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