"A Statistical Model to Predict Success Rate of Ion Fault Injection Attacks ..."

Liang Dai et al. (2014)

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DOI: 10.1109/CIS.2014.27

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Liang Dai, Huiyun Li, Guoqing Xu, Liying Xiong:
A Statistical Model to Predict Success Rate of Ion Fault Injection Attacks for Cryptographic ICs. CIS 2014: 430-434

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