"Gate-level process variation offset technique by using dual voltage ..."

Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada (2012)

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DOI: 10.1109/COOLCHIPS.2012.6216585

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada:
Gate-level process variation offset technique by using dual voltage supplies to achieve near-threshold energy efficient operation. COOL Chips 2012: 1-3

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