"A scalable soft spot analysis methodology for compound noise effects in ..."

Chong Zhao, Xiaoliang Bai, Sujit Dey (2004)

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DOI: 10.1145/996566.996804

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Chong Zhao, Xiaoliang Bai, Sujit Dey:
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits. DAC 2004: 894-899

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