"Computing the detection of Small Delay Defects caused by resistive opens ..."

Jose Luis Garcia-Gervacio, Víctor H. Champac (2010)

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DOI: 10.1109/ETSYM.2010.5512771

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Jose Luis Garcia-Gervacio, Víctor H. Champac:
Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. ETS 2010: 126-131

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