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"High-level path activation technique to speed up sequential circuit test ..."

Jaan Raik, Raimund Ubar (1999)

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DOI: 10.1109/ETW.1999.804289

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Jaan Raik, Raimund Ubar:
High-level path activation technique to speed up sequential circuit test generation. ETW 1999: 84-89

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