"Bucketing Failing Tests via Symbolic Analysis."

Van-Thuan Pham et al. (2017)

> Home

Details and statistics

DOI: 10.1007/978-3-662-54494-5_3

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/fase/PhamKRR17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/fase/PhamKRR17
Van-Thuan Pham, Sakaar Khurana, Subhajit Roy, Abhik Roychoudhury:
Bucketing Failing Tests via Symbolic Analysis. FASE 2017: 43-59

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.