"Random Pattern Testing for Sequential Circuits Revisited."

Lama Nachman et al. (1996)

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DOI: 10.1109/FTCS.1996.534593

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ftcs/NachmanSUR96
Lama Nachman, Kewal K. Saluja, Shambhu J. Upadhyaya, Robert Reuse:
Random Pattern Testing for Sequential Circuits Revisited. FTCS 1996: 44-52

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