"Combining Restorability and Error Detection Ability for Effective Trace ..."

Binod Kumar et al. (2017)

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DOI: 10.1145/3060403.3060475

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Binod Kumar, Ankit Jindal, Masahiro Fujita, Virendra Singh:
Combining Restorability and Error Detection Ability for Effective Trace Signal Selection. ACM Great Lakes Symposium on VLSI 2017: 191-196

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