"Fast Antirandom (FAR) Test Generation."

Anneliese von Mayrhauser et al. (1998)

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DOI: 10.1109/HASE.1998.731625

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Anneliese von Mayrhauser, Andre Bai, Tom Chen, Charles Anderson, Amjad Hajjar:
Fast Antirandom (FAR) Test Generation. HASE 1998: 262-269

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