"Built-In Self-Test for Multi-Port RAMs."

Vladimir Castro Alves et al. (1991)

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DOI: 10.1109/ICCAD.1991.185244

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois:
Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251

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