"A new built-in self-test approach for digital-to-analog and ..."

Karim Arabi, Bozena Kaminska, Janusz Rzeszut (1994)

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DOI: 10.1109/ICCAD.1994.629860

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Karim Arabi, Bozena Kaminska, Janusz Rzeszut:
A new built-in self-test approach for digital-to-analog and analog-to-digital converters. ICCAD 1994: 491-494

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