"The hype, myths, and realities of testing 3D integrated circuits."

Ran Wang et al. (2016)

> Home

Details and statistics

DOI: 10.1145/2966986.2980097

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iccad/WangDAC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccad/WangDAC16
Ran Wang, Sergej Deutsch, Mukesh Agrawal, Krishnendu Chakrabarty:
The hype, myths, and realities of testing 3D integrated circuits. ICCAD 2016: 58

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.