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"The topology and test technology of Digitally Controlled Potentiometers."

Wei Li, Zhan-You Sha, Bin Wang (2010)

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DOI: 10.1109/ICMLC.2010.5580663

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Wei Li, Zhan-You Sha, Bin Wang:
The topology and test technology of Digitally Controlled Potentiometers. ICMLC 2010: 2345-2349

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