"Properties of Effective Metrics for Coverage-Based Statistical Fault ..."

Shih-Feng Sun, Andy Podgurski (2016)

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DOI: 10.1109/ICST.2016.31

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Shih-Feng Sun, Andy Podgurski:
Properties of Effective Metrics for Coverage-Based Statistical Fault Localization. ICST 2016: 124-134

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