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"Electromigration failure rate of redundant via."

Jae-Gyung Ahn, Ping-Chin Yeh, Jonathan Chang (2018)

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DOI: 10.1109/IRPS.2018.8353671

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  dblp key:
  - conf/irps/AhnYC18
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  - https://dblp.org/rec/conf/irps/AhnYC18
Jae-Gyung Ahn, Ping-Chin Yeh, Jonathan Chang:
Electromigration failure rate of redundant via. IRPS 2018: 1

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