"Performance and reliability of strained SOI transistors for advanced ..."

Guillaume Besnard et al. (2015)

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DOI: 10.1109/IRPS.2015.7112691

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-16

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Guillaume Besnard, Xavier Garros, Alexandre Subirats, François Andrieu, X. Federspiel, M. Rafik, Walter Schwarzenbach, Gilles Reimbold, Olivier Faynot, Sorin Cristoloveanu:
Performance and reliability of strained SOI transistors for advanced planar FDSOI technology. IRPS 2015: 2

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