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"Nanoscale Analysis of Breakdown Induced Crack Propagation in DTSCR Devices."
Xinqian Chen et al. (2022)
- Xinqian Chen, Fei Hou, Zuoyuan Dong, Yuxin Zhang, Chaolun Wang, Fang Liang, Feibo Du, Zhiwei Liu, Xing Wu:
Nanoscale Analysis of Breakdown Induced Crack Propagation in DTSCR Devices. IRPS 2022: 48-1
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