"Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: ..."

Rosana Rodríguez et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129301

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas:
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. IRPS 2020: 1-7

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