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"Back gate bias effect and layout dependence on Random Telegraph Noise in ..."

P. Srinivasan et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405199

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/irps/SrinivasanSRLD21
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P. Srinivasan, Da Song, David Rose, Maurice LaCroix, Arunima Dasgupta:
Back gate bias effect and layout dependence on Random Telegraph Noise in FDSOI technologies. IRPS 2021: 1-4

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