"A Unified Physics-Based Stochastic Model for EM-Induced Resistance ..."

Valeriy Sukharev et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529301

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-05

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Valeriy Sukharev, Jun-Ho Choy, Armen Kteyan, J. Shuster-Passage, Seungman Choi, Martin Gall:
A Unified Physics-Based Stochastic Model for EM-Induced Resistance Degradation in BEoL Interconnect Segments. IRPS 2024: 1-10

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