"Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage ..."

Zhichao Chen et al. (2023)

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DOI: 10.1109/ISCAS46773.2023.10182219

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-31

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Zhichao Chen, Yang Xiao, Li Du, Yuan Du:
Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage Degradation and Differential-Pair-Based Memory Design. ISCAS 2023: 1-5

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