"Robust via-programmable ROM design based on 45nm process considering ..."

Byung-Jun Jang et al. (2015)

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DOI: 10.1109/ISCAS.2015.7169203

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Byung-Jun Jang, Chan-Ho Lee, Sung-Hun Sim, Kyu-Won Choi, Do-Hun Byun, Yeon-Ho Jung, Ki-Man Park, Dong-Yeon Heo, Gyu-Hong Kim, Joon-Sung Yang:
Robust via-programmable ROM design based on 45nm process considering process variation and enhancement Vmin and yield. ISCAS 2015: 2541-2544

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