"Fault Tolerant Computing Paradigm for Random Molecular Phenomena: Hopfield ..."

A. H. Tran et al. (2011)

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DOI: 10.1109/ISMVL.2011.21

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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A. H. Tran, Svetlana N. Yanushkevich, Sergey Edward Lyshevski, Vlad P. Shmerko:
Fault Tolerant Computing Paradigm for Random Molecular Phenomena: Hopfield Gates and Logic Networks. ISMVL 2011: 93-98

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