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"Augmenting ESD and EOS physical analysis with per pin ESD and leakage DFT."

Horaira Abu et al. (2018)

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DOI: 10.1109/ISQED.2018.8357259

access: closed

type: Conference or Workshop Paper

metadata version: 2018-05-15

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  dblp key:
  - conf/isqed/AbuAPM18
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  - https://dblp.org/rec/conf/isqed/AbuAPM18
Horaira Abu, Salem Abdennadher, Benoit Provost, Harry Muljono:
Augmenting ESD and EOS physical analysis with per pin ESD and leakage DFT. ISQED 2018: 20-24

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