"Test Application Time Reduction for Scan Circuits Using Limited Scan ..."

Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy (2004)

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DOI: 10.1109/ISQED.2004.1283675

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy:
Test Application Time Reduction for Scan Circuits Using Limited Scan Operations. ISQED 2004: 211-216

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