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"SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers."

Ramesh Harjani et al. (2021)

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DOI: 10.1109/ISSCC42613.2021.9365991

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-10

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  - conf/isscc/HarjaniCBHLSPLI21
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  - https://dblp.org/rec/conf/isscc/HarjaniCBHLSPLI21
Ramesh Harjani, Mike Chen, Marco Berkhout, Johan H. C. van den Heuvel, Thomas H. Lee, Robert Bogdan Staszewski, Kathleen Philips, Howard C. Luong, Vadim Ivanov:
SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers. ISSCC 2021: 541-542

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