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ORCID"2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, ..."
Ron Press, Erik H. Volkerink (2010)
- Ron Press, Erik H. Volkerink:
2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. IEEE Computer Society 2010, ISBN 978-1-4244-7206-2 [contents]
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