"Design and test of latch-based circuits to maximize performance, yield, ..."

Kun Young Chung, Sandeep K. Gupta (2010)

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DOI: 10.1109/TEST.2010.5699209

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-22

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Kun Young Chung, Sandeep K. Gupta:
Design and test of latch-based circuits to maximize performance, yield, and delay test quality. ITC 2010: 94-103

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