"A Variation of LSSD and Its Implications on Design and Test Pattern ..."

Sumit DasGupta et al. (1982)

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type: Conference or Workshop Paper

metadata version: 2006-06-19

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Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams:
A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC 1982: 63-66

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