"Application and Demonstration of a Digital Test Core: Optoelectronic Test ..."

John S. Davis et al. (2003)

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DOI: 10.1109/TEST.2003.1270837

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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John S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman:
Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174

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