"Maximization of power dissipation under random excitation for burn-in testing."

Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen (1998)

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DOI: 10.1109/TEST.1998.743200

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen:
Maximization of power dissipation under random excitation for burn-in testing. ITC 1998: 567-576

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