"Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture ..."

Vishal Jain, John A. Waicukauski (2002)

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DOI: 10.1109/TEST.2002.1041755

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Vishal Jain, John A. Waicukauski:
Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique. ITC 2002: 148-153

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