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"A novel test methodology based on error-rate to support error-tolerance."

Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer (2005)

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DOI: 10.1109/TEST.2005.1584081

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/LeeHB05
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  persistent URL:
  - https://dblp.org/rec/conf/itc/LeeHB05
Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer:
A novel test methodology based on error-rate to support error-tolerance. ITC 2005: 9

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