"An on-chip self-test architecture with test patterns recorded in scan chains."

Kuen-Jong Lee, Pin-Hao Tang, Michael A. Kochte (2016)

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DOI: 10.1109/TEST.2016.7805865

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Kuen-Jong Lee, Pin-Hao Tang, Michael A. Kochte:
An on-chip self-test architecture with test patterns recorded in scan chains. ITC 2016: 1-10

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