"Design of High-Level Test Language for Digital LSI."

Takuji Okamoto, Hiroyuki Shibata, Kozo Kinoshita (1983)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-05

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  - https://dblp.org/rec/conf/itc/OkamotoSK83
Takuji Okamoto, Hiroyuki Shibata, Kozo Kinoshita:
Design of High-Level Test Language for Digital LSI. ITC 1983: 508-513

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