"Open-short Normalization Method for a Quick Defect Identification in ..."

Yang Shang et al. (2021)

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DOI: 10.1109/ITC50571.2021.00032

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-29

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Yang Shang, Makoto Shinohara, Eiji Kato, Masaichi Hashimoto, Joanna Kiljan:
Open-short Normalization Method for a Quick Defect Identification in Branched Traces with High-resolution Time-domain Reflectometry. ITC 2021: 233-242

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