"ESD-Induced Internal Core Device Failure: New Failure Modes in ..."

Yoon Huh et al. (2005)

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DOI: 10.1109/IWSOC.2005.58

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yoon Huh, Peter Bendix, Kyungjin Min, Jau-Wen Chen, Ravindra Narayan, Larry D. Johnson, Steven H. Voldman:
ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. IWSOC 2005: 47-53

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