"Possibilities of defect-size magnification for testing resistive-opens in ..."

Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac (2014)

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DOI: 10.1109/LATW.2014.6841909

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - https://dblp.org/rec/conf/latw/Garcia-GervacioMC14
Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac:
Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies. LATW 2014: 1-6

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