"E-ECC: Low Power Erasure and Error Correction Schemes for Increasing ..."

Hsing Min Chen et al. (2015)

> Home

Details and statistics

DOI: 10.1145/2818950.2818961

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/memsys/ChenAWMC15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/memsys/ChenAWMC15
Hsing Min Chen, Akhil Arunkumar, Carole-Jean Wu, Trevor N. Mudge, Chaitali Chakrabarti:
E-ECC: Low Power Erasure and Error Correction Schemes for Increasing Reliability of Commodity DRAM Systems. MEMSYS 2015: 60-70

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.