"Simple Testing Can Prevent Most Critical Failures: An Analysis of ..."

Ding Yuan et al. (2014)

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type: Conference or Workshop Paper

metadata version: 2024-03-27

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Ding Yuan, Yu Luo, Xin Zhuang, Guilherme Renna Rodrigues, Xu Zhao, Yongle Zhang, Pranay Jain, Michael Stumm:
Simple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed Data-Intensive Systems. OSDI 2014: 249-265

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