"Scalable techniques and tools for reliability analysis of large circuits."

Debayan Bhaduri et al. (2007)

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DOI: 10.1109/VLSID.2007.139

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Debayan Bhaduri, Sandeep K. Shukla, Paul S. Graham, Maya B. Gokhale:
Scalable techniques and tools for reliability analysis of large circuits. VLSI Design 2007: 705-710

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