"Test Transformation to Improve Compaction by Statistical Encoding."

Hideyuki Ichihara et al. (2000)

> Home

Details and statistics

DOI: 10.1109/ICVD.2000.812624

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/IchiharaKPR00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/IchiharaKPR00
Hideyuki Ichihara, Kozo Kinoshita, Irith Pomeranz, Sudhakar M. Reddy:
Test Transformation to Improve Compaction by Statistical Encoding. VLSI Design 2000: 294-299

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.