"Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and ..."

Chang-Feng Yang et al. (2022)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830374

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type: Conference or Workshop Paper

metadata version: 2022-08-04

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Chang-Feng Yang, Chun-Yu Wu, Meng-Chun Shih, Ming-Ta Yang, Ming-Han Yang, Yu-Tien Wu, Ta-Chun Chien, Chih-Wei Lai, Shih-Chi Tsai, Wen-Ting Chu, Arthur Hung:
Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and Model of ppm Level Failures. VLSI Technology and Circuits 2022: 318-319

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