"High Coverage Analog Wafer-Probe Test Design and Co-optimization with ..."

Soumendu Bhattacharya, Abhijit Chatterjee (2003)

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DOI: 10.1109/VTEST.2003.1197638

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Soumendu Bhattacharya, Abhijit Chatterjee:
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS 2003: 89-100

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