"High Quality Robust Tests for Path Delay Faults."

Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer (1997)

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DOI: 10.1109/VTEST.1997.599447

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-21

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Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer:
High Quality Robust Tests for Path Delay Faults. VTS 1997: 88-93

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