"Concurrent process model and specification cause-effect monitoring using ..."

Shyam Kumar Devarakond et al. (2010)

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DOI: 10.1109/VTS.2010.5469536

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. VTS 2010: 337-342

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