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"Test-point insertion efficiency analysis for LBIST applications."

Miao Tony He et al. (2016)

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DOI: 10.1109/VTS.2016.7477314

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/HeCTTW16
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  persistent URL:
  - https://dblp.org/rec/conf/vts/HeCTTW16
Miao Tony He, Gustavo K. Contreras, Mark M. Tehranipoor, Dat Tran, LeRoy Winemberg:
Test-point insertion efficiency analysis for LBIST applications. VTS 2016: 1-6

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