"An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance."

Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer (2006)

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DOI: 10.1109/VTS.2006.18

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance. VTS 2006: 130-135

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